electron imaging

Slices from the top , bottom , sides and bulk of each specimen were examined by methanol exchange , quantitative determination of coarse and fine aggregate and backscattered electron imaging in the SEM .

分别从每个样条的顶部、底部、侧面和本体取样，通过甲醇交换，粗细集料的定量测定和在SEM中的背散射电子成像对试样进行检测。

The Environmental Scanning Electron Microscopes ( ESEM ) offers high resolution secondary electron imaging in a gaseous environment of practically any composition , at pressures as high as 6600 Pa , and temperatures as high as 1500 ℃ .

环境扫描电子显微镜在气体压力高达6600Pa，温度高达1500℃，具有任何气体种类的多气环境里，都可提供高分辨率的二次电子成像。

Secondary electron imaging of semiconductor dopants with the scanning electron microscope

掺杂半导体扫描电镜二次电子像

Observation of subsurface structures in cells and tissues with backscattered electron imaging

利用背散电子象和金属染色法观察组织和细胞的亚表面结构

Application of secondary electron imaging mode of electron microscopy to the metallographic study of special steels

电子显微镜二次电子成象模式在特殊钢金相研究中的应用

Some aspects about electron imaging , such as the calibration of electron velocity and the calculation of angular and kinetic energy distribution are also discussed .

还讨论了速度成像方法中速度分布校正和重构三维光电子动能分布及角分布等问题。

The microstructural evolution of permanent mould casting dendritic SiC p / ZA27 composite during partial remelting was investigated using back scattered electron imaging technique in scanning electron microscopy ( SEM ) .

用扫描电镜（SEM）背散射成像技术对金属型铸造树枝晶SiCp/ZA27复合材料部分重熔过程中的组织变化进行了观察。

Investment and operating cost of an electron beam imaging system

电子束成像系统经济效益的分析

Image Processing for Crystal Structure Determination by High Resolution Electron Microscopy Imaging

用高分辨电子显微像测定晶体结构的图像处理方法

A study of multi-energy point spread function in electron optical imaging systems

光电成象系统全色点扩散函数的研究

Theory of temporal aberrations for electron optical imaging systems by direct integral method

直接积分法研究电子光学成像系统的时间像差理论

Study on scanning electron acoustic imaging of monolithic multilayer piezoelectric actuator

多层独石式压电微位移器的扫描电声像研究

Compton scattering can be utilized for electron density imaging .

利用康普顿散射可以重建物质的电子密度图像。

A study on the stacking fault in GaN crystals by high-resolution electron microscope imaging

GaN晶体中堆垛层错的高分辨电子显微像研究

A new method for patterns making by using electron beam imaging in SiO2 film on silicon substrate is presented .

本文介绍了利用电子束成象在硅衬底上的薄二氧化硅膜中制作图形的一种新方法。

Test and verification of temporal aberration theory for electron optical imaging systems by an electrostatic concentric spherical system model

静电聚焦同心球系统验证电子光学成像系统的时间像差理论

The development of SEAM , physical process and advantages of electron acoustic imaging and principle of operation are described in this paper .

本文主要介绍了扫描电一声显微镜的发展，工作原理，电&声成像的物理过程和优点。

A new approach to calculate the temporal aberration coefficients of dynamic electron optical imaging systems is put forward in this paper .

提出了计算动态电子光学成像系统时间像差系数的新方法&直接积分法。

A new theory for studying temporal aberrations of dynamic electron optical imaging systems by the direct integral method ( DIM ) is put forward .

提出了直接积分法（DIM）研究动态电子光学成像系统时间像差的理论。

In 1948 , physicist Gabor invented holographic technology in the study of improving the quality of electron microscope imaging with the previous research .

1948年，物理学家伽柏（Gabor）在改善电子显微镜成像质量的研究中，在前人的启发下，发明了全息照相技术。

Compton scattering can be utilized for electron density imaging . Determination of SARA composition for hydrogenated residues using attenuated total reflectance infrared spectroscopy

利用康普顿散射光子能谱可以重建物质的电子密度图像。多重衰减全反射红外光谱测定加氢渣油四组分方法的建立

Applications of Secondary Electron Composition Contrast Imaging Method in Microstructure Studies on Heterojunction Semiconductor Devices and Materials

二次电子成分衬度成像方法在异质结半导体材料和器件的微结构研究中的应用

Crystal structure of K_2Nb_8O_ ( 21 ) has been studied by electron diffraction and lattice imaging technique .

用电子衍射和点阵象技术研究了K2Nb8O（21）晶体的结构。

During the martensitic transformation of Co-Al alloys stacking faults occur abundantly and sometimes a local ordered 21R structure can be found by electron diffraction and lattice imaging techniques .

用电子衍射和点阵象方法观察到Co-Al合金发生马氏体相变时产生大量层错，其中有局部的短程有序21R排列。